T. Easwarakhanthan: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Comparison between newly developed and classical determinations of index and thickness of thin films on substrates by ellipsometry

T. Easwarakhanthan, M. Remy

Journal:

Thin Solid Films

Year:

1996

Language:

english

File:

PDF, 715 KB

english, 1996

2

Optical modelling of photoluminescence emitted by thin doped films

P. Pigeat, T. Easwarakhanthan, J.L. Briançon, H. Rinnert

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 757 KB

english, 2011

3

Nonlinear Minimization Algorithm for Determining the Solar Cell Parameters with Microcomputers

EASWARAKHANTHAN, T., BOTTIN, J., BOUHOUCH, I., BOUTRIT, C.

Journal:

International Journal of Solar Energy

Year:

1986

Language:

english

File:

PDF, 164 KB

english, 1986

4

Surface roughness of AlN films deposited on negatively biased silicon and diamond substrates

Pigeat, P., Miska, P., Bougdira, J., Easwarakhanthan, T.

Journal:

Diamond and Related Materials

Year:

2009

Language:

english

File:

PDF, 1.11 MB

english, 2009

5

Forouhi-Bloomer and Tauc-Lorentz optical dispersions applied using spectroscopic ellipsometry to plasma-deposited fluorocarbon films

Easwarakhanthan, T., Beyssen, D., Le Brizoual, L., Alnot, P.

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 433 KB

english, 2007

6

Measurement of the interface layer thickness in SiO2/Si structures by single-wavelength null ellipsometry

Easwarakhanthan, T., Alnot, P.

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 161 KB

english, 1998

7

An inversion method for the complete characterization of transparent film-absorbing substrate systems using multiple angle ellipsometry

T. Easwarakhanthan, Z. Ouennoughi, S. Ravelet

Journal:

Solid-State Electronics

Year:

1992

Language:

english

File:

PDF, 730 KB

english, 1992

8

A new method for ellipsometric inversion with microcomputers: Characterization of optically absorbing films using multiple-angle-of-incidence

T. Easwarakhanthan, P. Mas, M. Renard, S. Ravelet

Journal:

Surface Science Letters

Year:

1989

Language:

english

File:

PDF, 87 KB

english, 1989

9

Characterization of double-layer transparent films on absorbing substrates using multiple-angle ellipsometry

T. Easwarakhanthan, Z. Ouennoughi, M. Renard, J.R. Cussenot

Journal:

Applied Surface Science

Year:

1991

Language:

english

File:

PDF, 550 KB

english, 1991

10

An ellipsometric procedure for the characterization of very thin surface films on absorbing substrates

T. Easwarakhanthan, S. Ravelet, P. Renard

Journal:

Applied Surface Science

Year:

1995

Language:

english

File:

PDF, 817 KB

english, 1995

11

Microcomputer-controlled simulator of a photovoltaic generator using a programmable voltage generator

T. Easwarakhanthan, J. Bottin, A. El-Slassi, R. Ravelet, S. Ravelet

Journal:

Year:

1986

Language:

english

File:

PDF, 395 KB

english, 1986

12

Substrate biasing effects on the microstructure of magnetron-sputtered AlN films investigated by in situ reflectance interferometry

P. Pigeat, T. Easwarakhanthan

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 1.21 MB

english, 2008

13

Optical models for radio-frequency-magnetron reactively sputtered AlN films

Easwarakhanthan, T., Assouar, M. B., Pigeat, P., Alnot, P.

Journal:

Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 409 KB

english, 2005

14

Numerical method for the ellipsometric determination of optical constants and thickness of thin films with microcomputers

T. Easwarakhanthan, C. Michel, S. Ravelet

Journal:

Surface Science

Year:

1988

Language:

english

File:

PDF, 564 KB

english, 1988

15

A new method for ellipsometric inversion with microcomputers: Characterization of optically absorbing films using multiple-angle-of-incidence

T. Easwarakhanthan, P. Mas, M. Renard, S. Ravelet

Journal:

Surface Science

Year:

1989

Language:

english

File:

PDF, 637 KB

english, 1989

16

Transparent and conducting ZnO films grown by spray pyrolysis

Hadjeris, Lazhar, Herissi, Labidi, Assouar, M Badreddine, Easwarakhanthan, Thomas, Bougdira, Jamal, Attaf, Nadhir, Aida, M Salah

Journal:

Semiconductor Science and Technology

Year:

2009

Language:

english

File:

PDF, 369 KB

english, 2009

17

THE IRISH MEDICAL SCHOOLS' AND GRADUATES' ASSOCIATION.

Pigeat, P., Miska, P., Bougdira, J., Easwarakhanthan, T.

Journal:

Year:

1890

Language:

english

File:

PDF, 368 KB

english, 1890

18

Structural and optical properties of magnetron-sputtered Er-doped AlN films grown under negative substrate bias

Legrand, Jérémy, Pigeat, Philippe, Easwarakhanthan, Thomas, Rinnert, Hervé

Journal:

Applied Surface Science

Year:

2014

Language:

english

File:

PDF, 1.46 MB

english, 2014

19

Characterization of energetic and thermalized sputtered atoms in pulsed plasma using time-resolved tunable diode-laser induced fluorescence

Desecures, M., de Poucques, L., Easwarakhanthan, T., Bougdira, J.

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 1.96 MB

english, 2014

20

Spectroellipsometric investigation of optical, morphological, and structural properties of reactively sputtered polycrystalline AlN films

Easwarakhanthan, T., Hussain, S. S., Pigeat, P.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2010

Language:

english

File:

PDF, 800 KB

english, 2010

21

Spectroellipsometric analysis of CHF[sub 3] plasma-polymerized fluorocarbon films

Easwarakhanthan, T., Beyssen, D., Le Brizoual, L., Bougdira, J.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2006

Language:

english

File:

PDF, 528 KB

english, 2006

22

Semiempirical expressions for solar cell fill factors

Easwarakhanthan, T., Bouhouch, L., Bottin, J., Nguyen, P.H.

Journal:

Electronics Letters

Year:

1985

Language:

english

File:

PDF, 278 KB

english, 1985

23

Nulling ellipsometry in the study of chemically treated Si surfaces

Easwarakhanthan, T

Journal:

Journal of Physics D Applied Physics

Year:

1997

Language:

english

File:

PDF, 116 KB

english, 1997

24

Error propagation in fixed-point ellipsometric inversions

T. Easwarakhanthan, P. Pigeat

Year:

2003

Language:

english

File:

PDF, 322 KB

english, 2003

25

Numerical calibration of the angle of incidence in ellipsometers

T. Easwarakhanthan, S. Ravelet

Year:

1996

Language:

english

File:

PDF, 141 KB

english, 1996

26

10.1088/0022-3727/34/7/305

F. Bénédic, M. Belmahi, T. Easwarakhanthan, P. Alnot

Year:

2001

Language:

english

File:

PDF, 415 KB

english, 2001

27

Controlling refractive index in AlN films by texture and crystallinity manipulation

Giba, A.E., Pigeat, P., Bruyere, S., Easwarakhanthan, T., Mucklich, F., Horwat, David

Journal:

Thin Solid Films

Year:

2017

Language:

english

File:

PDF, 1.28 MB

english, 2017

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски